RE-NET HIST: Reliable Neural-Interface Technology - Histology for Interface Stability over-time

The Histology for Interface Stability over Time (HIST) effort identifies leading mechanisms of interface degradation and failure. HIST teams are also developing new invasive and non-invasive histology methods to assess neural-recording-interface status and performance, accurate predictive models of interface performance, and methods to reduce the time required to assess and develop robust interfaces. 

Technical Area #1: Quantitatively identify dominant failure mechanisms of neural-recording interfaces, with objectivity and strong statistical confidence.  Performers in the HIST effort uncovered serious problems with electrode degradation, interconnect failure, blood-brain-barrier breach and microglia degeneration. 

Technical Area #2:  Develop new quantitative in-vitro and in-vivo techniques for assessing neural-recording-interface degradation and failure. For this purpose, the Farsight tool was refined and applied to quantitatively assess biological response to cortical implants. 

Technical Area #3: Predict the failure of neural-recording interfaces by creating new statistically validated models and early-precursor-signal-based techniques. Researchers identified measures of electrode impedance that were indicative of electrode failure.

Technical Area #4: Accelerate the failure of neural-recording interfaces by creating new statistically validated models and stressor-signal-based techniques. In this final TA, researchers developed new lines of transgenic animals and microfluidic platforms to accelerate the biological tissue response associated with interface failure; and developed “artificial brain” preps to bench-test electrode degradation.